Nanoscope Afm Manual
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A Veeco (formerly Digital Instruments) Nanoscope III was installed in September 2005.
This instrument is capable of tapping and contact-mode atomic force microscopy (AFM), scanning tunneling microscopy (STM), magnetic force microscopy, and force-modulation microscopy.
In addition, it has a multimode heater and cooler for in-situ studies.
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Instrument Specifications
Nanoscope Afm Manual Download
Scanner Range (XxYxZ)
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Noise
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Sample Size
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Vibrational and Acoustic Isolation
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